Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F07%3A00016558" target="_blank" >RIV/61989100:27350/07:00016558 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films
Original language description
A method for characterization of sub-nanometer thick Co/V and Co/Mo interfaces is proposed that uses magneto-optical ellipsometry. Both the polar Kerr rotation and ellipticity are fitted simultaneously to different models of interface layer. The magneto-optical data are measured for varying thicknesses of the cobalt layer and overlayer by scanning of a laser beam over the samples with two orthogonal wedges. Decrease of magneto-optical effect at both interfaces Co/V and Co/Mo were observed, which corresponds to interface layers of thicknesses ranging from one to two monoatomic layers. In the case of vanadium, the interface layer is sharper and can be explained either by reduced magnetic moment of cobalt, or by anti-parallel magnetic moment of vanadium near the Co/V interface.
Czech name
Vliv V a Mo krycích vrstev na magnetooptický jev v ultratenké Co vrstvě
Czech description
Vliv V a Mo krycích vrstev na magnetooptický jev v ultratenké Co vrstvě

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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