Highly sensitive displacement measurement utilizing the wavelength interrogation

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F15%3A86095341" target="_blank" >RIV/61989100:27350/15:86095341 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2191198" target="_blank" >http://dx.doi.org/10.1117/12.2191198</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2191198" target="_blank" >10.1117/12.2191198</a>

Result language
angličtina
Original language name
Highly sensitive displacement measurement utilizing the wavelength interrogation
Original language description
Spectral interferometric methods utilizing the interference of two beams in a Michelson interferometer to measure the displacement are analyzed theoretically and experimentally. First we consider an experimental setup comprising a white-light source, a dispersion balanced Michelson interferometer and a spectrometer. The position of one of the interferometer mirrors is controlled via a piezo positioning system and the displacement measurement is based on the wavelength interrogation, i.e., the position of a selected interference fringe in the resultant channeled spectrum is measured as a function of the mirror displacement. Second we consider a setup with another interferometer, included in the Michelson interferometer, to increase the sensitivity of the displacement measurement. In this setup, the resultant channeled spectrum is with envelope which shifts with the displacement of the interferometer mirror. We analyze the new measurement method theoretically and show that the displaceme
Czech name
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Czech description
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Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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