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Synthesis, Characterization, and Enhanced Optical and Dielectric Properties of Pure and Ni-Doped ZnO Nanoparticles for Advanced Electronic Applications

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27360%2F25%3A10257600" target="_blank" >RIV/61989100:27360/25:10257600 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S2590123025009016" target="_blank" >https://www.sciencedirect.com/science/article/pii/S2590123025009016</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.rineng.2025.104824" target="_blank" >10.1016/j.rineng.2025.104824</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Synthesis, Characterization, and Enhanced Optical and Dielectric Properties of Pure and Ni-Doped ZnO Nanoparticles for Advanced Electronic Applications

  • Original language description

    Nickel (Ni)-doped zinc oxide (ZnO) nanoparticles have garnered significant attention due to their tunable structural, optical, and electronic properties, making them ideal candidates for various advanced applications. This study focuses on the synthesis, characterization, and evaluation of the electrical and electronic properties of pure and Ni-doped ZnO nanoparticles (Ni:ZnO) synthesized via a co-precipitation method with varying Ni concentrations (2%, 4%, 6%, and 8%). X-ray diffraction analysis confirmed the wurtzite hexagonal structure of ZnO, with lattice distortion increasing proportionally to Ni doping. A secondary NiO phase was detected at higher doping levels, indicating the solubility limit of Ni in ZnO. The average crystallite size, calculated using Debye-Scherrer&apos;s equation, decreased from 31 nm in pure ZnO to 23 nm in 8% Ni-doped ZnO, confirming doping-induced size reduction. UV-visible spectroscopy revealed a blue shift in the optical bandgap from 3.23 eV for pure ZnO to 3.41 eV for 8% Ni-doped ZnO, attributed to Burstein-Moss effect. Fourier transform infrared spectroscopy identified changes in vibrational modes, with shifts in peaks corresponding to Zn-O and Ni-O bonds, indicating successful Ni incorporation. Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy confirmed uniform particle morphology and elemental composition. Dielectric studies showed that the dielectric constant increased significantly with Ni doping, reaching a maximum value of 69 at 6% doping, while AC conductivity improved with frequency, demonstrating frequency-dependent conductivity due to hopping charge carriers. The findings reveal that Ni doping enhances the structural, optical, and dielectric properties of ZnO, making it suitable for optoelectronics, high-frequency devices, and dielectric materials.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20500 - Materials engineering

Result continuities

  • Project

  • Continuities

    O - Projekt operacniho programu

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Results in Engineering

  • ISSN

    2590-1230

  • e-ISSN

    2590-1230

  • Volume of the periodical

    26

  • Issue of the periodical within the volume

    104824

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    10

  • Pages from-to

    nestránkováno

  • UT code for WoS article

    001469790700001

  • EID of the result in the Scopus database

    2-s2.0-105002007394