Mueller matrix ellipsometry of waveplates for control of their properties and alignment

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F20%3A10243448" target="_blank" >RIV/61989100:27640/20:10243448 - isvavai.cz</a>

Alternative codes found

RIV/61989100:27740/20:10243448

Result on the web

<a href="https://avs.scitation.org/doi/10.1116/1.5129615" target="_blank" >https://avs.scitation.org/doi/10.1116/1.5129615</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1116/1.5129615" target="_blank" >10.1116/1.5129615</a>

Result language

angličtina

Original language name

Mueller matrix ellipsometry of waveplates for control of their properties and alignment

Original language description

In this paper, the authors characterize high-order quartz waveplates in the wide spectral range (from 193 to 1700 nm) using a commercial Mueller matrix ellipsometer RC2-DI-Woollam. They demonstrate that Mueller matrix ellipsometry is a powerful tool to obtain the waveplate retardation in a wide spectral range together with azimuthal angles of optical axes with good accuracy. Moreover, they deal with depolarization caused by a finite monochromator bandwidth, which is included in the model using incoherent averaging of Mueller matrices. The application of Lu-Chipman Mueller matrix decomposition to extract depolarization from data is also demonstrated. Finally, Lu-Chipman decomposition is used to demonstrate the presence of the optical activity in quartz, which one may misinterpret with incorrect alignment of the waveplate azimuth angle. (C) 2019 Author(s).

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10306 - Optics (including laser optics and quantum optics)

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2020

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

ISSN

2166-2746

e-ISSN

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Volume of the periodical

38

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

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UT code for WoS article

000569097500022

EID of the result in the Scopus database

2-s2.0-85077087935