Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27740%2F24%3A10255806" target="_blank" >RIV/61989100:27740/24:10255806 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/24:00598459 RIV/00216208:11320/24:10483285
Result on the web
<a href="https://www.sciencedirect.com/science/article/abs/pii/S0169433224015800?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/abs/pii/S0169433224015800?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2024.160867" target="_blank" >10.1016/j.apsusc.2024.160867</a>
Alternative languages
Result language
angličtina
Original language name
Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling
Original language description
A basic knowledge on chemical stability and reactivity of a wide band gap ScN semiconductor in the presence of air atmosphere, where O2 and H2O represent the main degradation or corrosive agents, is of vital importance for a long-term performance of ScN-based devices for thermoelectric applications. Here, we present a systematic XPS Ar+ depth profiling analysis and optical and TEM characterizations of naturally room temperature air-aged thin ScN films prepared by a high-temperature DC sputtering on MgO(0 0 1) and SiO2 substrates. We find that superior crystalline quality ScN/MgO films degrade weakly after their quick initial surface oxidation and/or hydrolysis. Their oxidation is rather local and associated with the film-penetrating void-like interfaces. Significant initial surface oxidation and subsequent bulk oxidation after ageing is, however, observed for polycrystalline ScN/SiO2 films. Ab initio calculations of pure ScN and ScN with diluted nitrogen vacancies and/or substitutional oxygen impurities, which assist our experimental research, reveal pronounced impact of these defects on the ScN electronic structure. The modeled compositions reflect homogeneously and weakly oxidized films, while the real films correspond to relatively pure ScN crystallites with interfaces rich in oxygen. (C) 2024 Elsevier B.V.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
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Volume of the periodical
674
Issue of the periodical within the volume
November
Country of publishing house
US - UNITED STATES
Number of pages
19
Pages from-to
nestránkováno
UT code for WoS article
001295721200001
EID of the result in the Scopus database
2-s2.0-85201122479