Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F24%3A00598459" target="_blank" >RIV/68378271:_____/24:00598459 - isvavai.cz</a>
Alternative codes found
RIV/61989100:27740/24:10255806 RIV/00216208:11320/24:10483285
Result on the web
<a href="https://doi.org/10.1016/j.apsusc.2024.160867" target="_blank" >https://doi.org/10.1016/j.apsusc.2024.160867</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2024.160867" target="_blank" >10.1016/j.apsusc.2024.160867</a>
Alternative languages
Result language
angličtina
Original language name
Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling
Original language description
A basic knowledge on chemical stability and reactivity of a wide band gap ScN semiconductor in the presence of air atmosphere, where O2 and H2O represent the main degradation or corrosive agents, is of vital importance for a long-term performance of ScN-based devices for thermoelectric applications. Here, we present a systematic XPS Ar+ depth profiling analysis and optical and TEM characterizations of naturally room temperature air-aged thin ScN films prepared by a high-temperature DC sputtering on MgO(0 0 1) and SiO2 substrates. We find that superior crystalline quality ScN/MgO films degrade weakly after their quick initial surface oxidation and/or hydrolysis.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
1873-5584
Volume of the periodical
674
Issue of the periodical within the volume
Nov
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
19
Pages from-to
160867
UT code for WoS article
001295721200001
EID of the result in the Scopus database
2-s2.0-85201122479