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Effect of deposition conditions on mechanical properties of magnetron sputtered SiC thin films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F12%3A33141402" target="_blank" >RIV/61989592:15310/12:33141402 - isvavai.cz</a>

  • Alternative codes found

    RIV/49777513:23640/12:43917344

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Effect of deposition conditions on mechanical properties of magnetron sputtered SiC thin films

  • Original language description

    The interdependence of mechanical properties (hardness, elastic modulus, internal stress, coefficient of friction), structure and composition of various amorphous and nanocrystalline DC magnetron and DC reactive magnetron sputtered SiC a SiC:H films wasstudied. Composition was determined by electron micro analyses and structure was investigated using Raman spectroscopy. Indentation hardness and reduced modulus were measured by instrumented nanoindentation, the coefficient of friction was evaluated using pin-on-disc method. It has been shoved that mechanical and tribological properties of a-SiC are strongly influenced by conditions of deposition process. Using appropriate deposition setup it is possible to obtain superhard nanocrystalline films with hardness of 40 GPa (higher than ?-SiC) as well as films compromising high hardness (approx. 19 GPa) and relatively low friction (approx. 0.15).

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Chemické listy

  • ISSN

    0009-2770

  • e-ISSN

  • Volume of the periodical

    106

  • Issue of the periodical within the volume

    SI3

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    4

  • Pages from-to

    "s395"-"s398"

  • UT code for WoS article

    000314237900010

  • EID of the result in the Scopus database