Measurement uncertainty of phase measuring deflectometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F23%3A73620193" target="_blank" >RIV/61989592:15310/23:73620193 - isvavai.cz</a>
Result on the web
<a href="https://opg.optica.org/ao/viewmedia.cfm?uri=ao-62-7-1769&seq=0" target="_blank" >https://opg.optica.org/ao/viewmedia.cfm?uri=ao-62-7-1769&seq=0</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/AO.483720" target="_blank" >10.1364/AO.483720</a>
Alternative languages
Result language
angličtina
Original language name
Measurement uncertainty of phase measuring deflectometry
Original language description
Phase measuring deflectometry (PMD) is a proven optical measurement method for measuring the shapes of objects. This method is suitable for measuring the shape of an object with an optically smooth (mirror-like) surface. The measured object is used as a mirror through which the camera observes a defined geometric pattern. We derive the theoretical limit of measurement uncertainty using the Cramer-Rao inequality. It shows that the measurement uncertainty is expressed in the form of an uncertainty product. The factors of the product are the angular uncer-tainty and lateral resolution. The magnitude of the uncertainty product depends on the mean wavelength of the light used and the number of photons detected. The calculated measurement uncertainty is compared with the measurement uncertainty of other deflectometry methods
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/EF16_019%2F0000754" target="_blank" >EF16_019/0000754: Nanotechnologies for Future</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Optics
ISSN
1559-128X
e-ISSN
2155-3165
Volume of the periodical
62
Issue of the periodical within the volume
7
Country of publishing house
US - UNITED STATES
Number of pages
8
Pages from-to
1769-1776
UT code for WoS article
000952540800003
EID of the result in the Scopus database
2-s2.0-85149103221