In-situ preparation of plant samples in ESEM for energy dispersive x-ray microanalysis and repetitive observation in SEM and ESEM

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F62156489%3A43210%2F19%3A43915345" target="_blank" >RIV/62156489:43210/19:43915345 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/19:00508297

Result on the web

<a href="https://doi.org/10.1038/s41598-019-38835-w" target="_blank" >https://doi.org/10.1038/s41598-019-38835-w</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1038/s41598-019-38835-w" target="_blank" >10.1038/s41598-019-38835-w</a>

Result language

angličtina

Original language name

In-situ preparation of plant samples in ESEM for energy dispersive x-ray microanalysis and repetitive observation in SEM and ESEM

Original language description

The Extended Low Temperature Method (ELTM) for the in-situ preparation of plant samples in an environmental scanning electron microscope enables carrying out repetitive topographical and material analysis at a higher resolution in the vacuum conditions of a scanning electron microscope or in the low gas pressure conditions of an environmental scanning electron microscope. The method does not require any chemical intervention and is thus suitable for imaging delicate structures rarely observable with common treatment methods. The method enables both sample stabilization as close to their native state as possible, as well as the transfer of the same sample from a low vacuum to an atmospheric condition for sample storage or later study. It is impossible for wet samples in the environmental scanning electron microscope. Our studies illustrate the high applicability of the ELTM for different types of plant tissue, from imaging of plant waxes at higher resolution, the morphological study of highly susceptible early somatic embryos to the elemental microanalysis of root cells. The method established here provides a very fast, universal and inexpensive solution for plant sample treatment usable in a commercial environmental scanning electron microscope equipped with a cooling Peltier stage.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10700 - Other natural sciences

Project

<a href="/en/project/GA19-03909S" target="_blank" >GA19-03909S: Advanced simulations of electron-gas interactions for high-efficiency detection of secondary electrons under dynamic in-situ experiments in ESEM.</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2019

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Scientific Reports

ISSN

2045-2322

e-ISSN

—

Volume of the periodical

9

Issue of the periodical within the volume

19 February

Country of publishing house

GB - UNITED KINGDOM

Number of pages

8

Pages from-to

2300

UT code for WoS article

000459092800070

EID of the result in the Scopus database

2-s2.0-85061775177