Imaging of Norway spruce early somatic embryos with the ESEM, Cryo-SEM and laser scanning microscope

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00461452" target="_blank" >RIV/68081731:_____/16:00461452 - isvavai.cz</a>
Alternative codes found
RIV/62156489:43210/16:43909356
Result on the web
<a href="http://dx.doi.org/10.1016/j.micron.2016.02.011" target="_blank" >http://dx.doi.org/10.1016/j.micron.2016.02.011</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.micron.2016.02.011" target="_blank" >10.1016/j.micron.2016.02.011</a>

Result language
angličtina
Original language name
Imaging of Norway spruce early somatic embryos with the ESEM, Cryo-SEM and laser scanning microscope
Original language description
This article describes the surface structure of Norway spruce early somatic embryos (ESEs) as a typical culture with asynchronous development. The microstructure of extracellular matrix covering ESEs were observed using the environmental scanning electron microscope as a primary tool and using the scanning electron microscope with cryo attachment and laser electron microscope as a complementary tool allowing our results to be proven independently. The fresh samples were observed in conditions of the air environment of the environmental scanning electron microscope (ESEM) with the pressure from 550 Pa to 690 Pa and the low temperature of the sample from -18 degrees C to -22 degrees C. The samples were studied using two different types of detector to allow studying either the thin surface structure or material composition. The scanning electron microscope with cryo attachment was used for imaging frozen extracellular matrix microstructure with higher resolution. The combination of both electron microscopy methods was suitable for observation of "native" plant samples, allowing correct evaluation of our results, free of error and artifacts.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
<a href="/en/project/GA14-22777S" target="_blank" >GA14-22777S: The study of electron-gas interactions in conditions of pressure gradient of low energy environmental scanning electron microscope.</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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