Extremely Lightweight X-Ray Optics Based on Thin Substrates
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985815%3A_____%2F11%3A00373080" target="_blank" >RIV/67985815:_____/11:00373080 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21340/11:00192025 RIV/68407700:21230/11:00192025
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Extremely Lightweight X-Ray Optics Based on Thin Substrates
Original language description
We report on recent progress with development of astronomical X-ray optics based on bent Si wafers. Recent efforts with Si wafers have been focused on new forming technologies such as method of deposition of thin layers. The role of substrates quality inperformance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BN - Astronomy and celestial mechanics, astrophysics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/IAAX01220701" target="_blank" >IAAX01220701: Material and X-Ray Optical Properties of Formed Silicon Monocrystals</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EUV and X-Ray Optics: Synergy between Laboratory and Space II
ISBN
9780819486660
ISSN
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e-ISSN
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Number of pages
9
Pages from-to
"807604/1"-"807604/9"
Publisher name
SPIE
Place of publication
Bellingham
Event location
Prague
Event date
Apr 20, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000297594500004