An investigation into graphene exfoliation and potential graphene application in MEMS devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985831%3A_____%2F11%3A00375446" target="_blank" >RIV/67985831:_____/11:00375446 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.878965" target="_blank" >http://dx.doi.org/10.1117/12.878965</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.878965" target="_blank" >10.1117/12.878965</a>
Alternative languages
Result language
angličtina
Original language name
An investigation into graphene exfoliation and potential graphene application in MEMS devices
Original language description
The design of microelectromecanical systems (MEMS) and micro-opto- electromechanical systems (MOEMS) are often materials-limited with respect to the efficiency and capability of the material. Graphene, a one atom thick honeycomb lattice of carbon, is a highly desired material for MEMS applications. Relevant properties of graphene include the material's optical transparency, mechanical strength, energy efficiency, and electrical and thermal conductivity due to its electron mobility. Aforementioned properties make graphene a strong candidate to supplant existing transparent electrode technology and replace the conventionally used material, indium-tin oxide. In this paper we present preliminary results on work toward integration of graphene with MEMS structures. We are studying mechanical exfoliation of highly ordered pyrolytic graphite (HOPG) crystals by repeatedly applying and separating adhesive materials from the HOPG surface.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
DB - Geology and mineralogy
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
ISBN
978-0-8194-8465-9
ISSN
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e-ISSN
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Number of pages
7
Pages from-to
"79280P"-"79280P"
Publisher name
SPIE - International Society Optical Engeneering
Place of publication
Bellingham
Event location
San Francisco
Event date
Jan 24, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000297982500023