VT STM investigations of Ag film growth on Bi2Te3./sub
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F03%3A00105934" target="_blank" >RIV/67985882:_____/03:00105934 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
VT STM investigations of Ag film growth on Bi2Te3./sub
Original language description
We carried out STM/STS studies of Ag structures grown on Bi2Te3 surface at different temperatures. We got images of surface of the substrate, which shoved a layered structure with many monoatomic terraces. We observed different I-V characteristics and contrast on CITS maps. The dI/dV curves were compared with theoretically calculated DOS of Bi p and Te-1 p orbitals. The diameters and densities of Ag clusters deposited on the Bi2Te3 substrate were dependent on the substrate temperature.
Czech name
VT STM zkoumání Ag vrstvy narostené na Bi2Te3./sub
Czech description
Je prezentována STM/STS studie Ag struktur narostených na povrchu Bi2Te3, tvořeným mnoha monoatomickými terasami, při různých teplotách. Průměr a hustota narostených Ag klastrů jsou závislé na teplotě Bi2Te3 substrátu. Na vzorku jsou naměřeny ruzné I-V charakteristiky a kontrast na CITS mapách. Křivky dI/dV jsou porovnány s teoreticky vypočtenou hustotou stavů Bi p a Te-1 p orbitalů.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F02%2F0098" target="_blank" >GA202/02/0098: Study of very thin Bi2Te3 films prepared by laser ablation and their modification by scanning tunneling microscope(STm)</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
STM'2003 - 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
ISBN
0-7354-0168-3
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
853-858
Publisher name
American Institute of Physics
Place of publication
New York
Event location
Eindhoven
Event date
Jul 21, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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