Periodic Oscillations of Thin Film Properties with Their Thickness for Mixed Real Bi2(M+N)Te3N Phases
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F05%3A00113039" target="_blank" >RIV/68407700:21460/05:00113039 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Periodic Oscillations of Thin Film Properties with Their Thickness for Mixed Real Bi2(M+N)Te3N Phases
Original language description
Thin films were grown by pulsed laser deposition from Bi2Te3 target on fused silica substrates at substrate temperature of 410 °C. The reproducibility of the process was confirmed. The films were completely crystalline, textured with BiTe, Bi2Te3 and Bi3Te4 phases present. Bi/Te ratio in the films varied from 1.15 to 1.23. Films with various thicknesses were grown at the same deposition conditions in the second experiment. Film thickness varied from 20 to 350 nm. Hall mobility and the concentration of carrier of the films with different thicknesses were measured and oscillations were observed.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
V - Vyzkumna aktivita podporovana z jinych verejnych zdroju
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Coatings Technology
ISSN
0257-8972
e-ISSN
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Volume of the periodical
200
Issue of the periodical within the volume
1-4
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
3
Pages from-to
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UT code for WoS article
000232327800060
EID of the result in the Scopus database
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