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Detection of hydrogen at room temperature with graphite-Pt nanoparticles/Si Schottky diodes

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F13%3A00426906" target="_blank" >RIV/67985882:_____/13:00426906 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/SMICND.2013.6688078" target="_blank" >http://dx.doi.org/10.1109/SMICND.2013.6688078</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/SMICND.2013.6688078" target="_blank" >10.1109/SMICND.2013.6688078</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Detection of hydrogen at room temperature with graphite-Pt nanoparticles/Si Schottky diodes

  • Original language description

    Hydrogen sensing characteristics of graphite based Schottky diodes fabricated by printing colloidal graphite on bare n-type Si substrates and those partly covered with Pt nanoparticles (NPs) was investigated. Decoration of Si substrates with Pt NPs was performed by electrophoretic deposition. We demonstrate that the post-deposition thermal treatment can extensively influence the morphology of the deposited Pt NPs as well as the sensing properties of graphite-Pt NPs/Si Schottky diodes

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/LD12014" target="_blank" >LD12014: Role of the interface in the preparation of high quality Schottky barriers on III-V semiconductors.</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the International Semiconductor Conference 2013, CAS

  • ISBN

    978-1-4673-5670-1

  • ISSN

    1545-827X

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    23-26

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Sinaia

  • Event date

    Oct 14, 2013

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000330180800004