Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F18%3A00503508" target="_blank" >RIV/67985882:_____/18:00503508 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >http://dx.doi.org/10.1109/TMTT.2018.2830332</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >10.1109/TMTT.2018.2830332</a>
Alternative languages
Result language
angličtina
Original language name
Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials
Original language description
In this paper, the generalized substrate integrated waveguide (SIW) cavity technique is presented for the retrieval of broadband complex permittivity of medium loss dielectrics using a number of higher order modes of the proposed cavity. The proposed SIW cavity design improves the coupling by implementing a novel feeding topology to achieve a better quality factor for the higher order TE10n modes as compared with the conventional SIW feeding arrangement. The conventional SIW cavity perturbation formula is modified to overcome various limitations of the SIW topology, such as the lower Q-factor, lower sample to cavity volume ratio, and larger frequency shifts observed for the higher order modes. The applicability of the proposed technique is first numerically validated using independent data obtained with the help of full-wave electromagnetic solver, and then, the accuracy is compared with various cavity based techniques available in the literature. Finally, the proposed SIW cavity sensor is fabricated on Rogers' RT5880 substrate, where a number of standard RF substrates are tested using the network analyzer. The proposed generalized scheme based on the improved SIW cavity provides reasonably accurate values of the complex permittivity of the medium-loss dielectric substrates at multiband of microwave frequency in the range of 10-20 GHz
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
IEEE Transactions on Microwave Theory and Techniques
ISSN
0018-9480
e-ISSN
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Volume of the periodical
66
Issue of the periodical within the volume
6
Country of publishing house
US - UNITED STATES
Number of pages
10
Pages from-to
3063-3072
UT code for WoS article
000434463600017
EID of the result in the Scopus database
2-s2.0-85046720864