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Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F18%3A00503508" target="_blank" >RIV/67985882:_____/18:00503508 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >http://dx.doi.org/10.1109/TMTT.2018.2830332</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >10.1109/TMTT.2018.2830332</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials

  • Original language description

    In this paper, the generalized substrate integrated waveguide (SIW) cavity technique is presented for the retrieval of broadband complex permittivity of medium loss dielectrics using a number of higher order modes of the proposed cavity. The proposed SIW cavity design improves the coupling by implementing a novel feeding topology to achieve a better quality factor for the higher order TE10n modes as compared with the conventional SIW feeding arrangement. The conventional SIW cavity perturbation formula is modified to overcome various limitations of the SIW topology, such as the lower Q-factor, lower sample to cavity volume ratio, and larger frequency shifts observed for the higher order modes. The applicability of the proposed technique is first numerically validated using independent data obtained with the help of full-wave electromagnetic solver, and then, the accuracy is compared with various cavity based techniques available in the literature. Finally, the proposed SIW cavity sensor is fabricated on Rogers' RT5880 substrate, where a number of standard RF substrates are tested using the network analyzer. The proposed generalized scheme based on the improved SIW cavity provides reasonably accurate values of the complex permittivity of the medium-loss dielectric substrates at multiband of microwave frequency in the range of 10-20 GHz

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10306 - Optics (including laser optics and quantum optics)

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    IEEE Transactions on Microwave Theory and Techniques

  • ISSN

    0018-9480

  • e-ISSN

  • Volume of the periodical

    66

  • Issue of the periodical within the volume

    6

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    10

  • Pages from-to

    3063-3072

  • UT code for WoS article

    000434463600017

  • EID of the result in the Scopus database

    2-s2.0-85046720864