All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Highly Rectifying Heterojunctions Formed by Annealed ZnO Nanorods on GaN Substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F20%3A00538098" target="_blank" >RIV/67985882:_____/20:00538098 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216208:11320/20:10423795

  • Result on the web

    <a href="https://doi.org/10.3390/nano10030508" target="_blank" >https://doi.org/10.3390/nano10030508</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/nano10030508" target="_blank" >10.3390/nano10030508</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Highly Rectifying Heterojunctions Formed by Annealed ZnO Nanorods on GaN Substrates

  • Original language description

    We study the effect of thermal annealing on the electrical properties of the nanoscale p-n heterojunctions based on single n-type ZnO nanorods on p-type GaN substrates. The ZnO nanorods are prepared by chemical bath deposition on both plain GaN substrates and on the substrates locally patterned by focused ion beam lithography. Electrical properties of single nanorod heterojunctions are measured with a nanoprobe in the vacuum chamber of a scanning electron microscope. The focused ion beam lithography provides a uniform nucleation of ZnO, which results in a uniform growth of ZnO nanorods. The specific configuration of the interface between the ZnO nanorods and GaN substrate created by the focused ion beam suppresses the surface leakage current and improves the current-voltage characteristics. Further improvement of the electrical characteristics is achieved by annealing of the structures in nitrogen, which limits the defect-mediated leakage current and increases the carrier injection efficiency

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nanomaterials

  • ISSN

    2079-4991

  • e-ISSN

  • Volume of the periodical

    10

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    13

  • Pages from-to

    508

  • UT code for WoS article

    000526090400108

  • EID of the result in the Scopus database

    2-s2.0-85081561393