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Electrical properties of nanoscale p-n heterojunctions formed between a single ZnO nanorod and GaN substrate

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F20%3A00538001" target="_blank" >RIV/67985882:_____/20:00538001 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1016/j.mssp.2019.104808" target="_blank" >https://doi.org/10.1016/j.mssp.2019.104808</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.mssp.2019.104808" target="_blank" >10.1016/j.mssp.2019.104808</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Electrical properties of nanoscale p-n heterojunctions formed between a single ZnO nanorod and GaN substrate

  • Original language description

    We study electronic transport in single vertically oriented n-type ZnO nanorods on p-type GaN substrates using a nanoprobe in a scanning electron microscope. The ZnO nanorods are prepared by chemical bath deposition on both plain GaN substrates and the substrates locally modified by focused ion beam. The heterojunctions on focused ion beam-modified substrates show rectifying current-voltage characteristics, while the characteristics of the plain structures are symmetrical. Adsorption/desorption processes on the surface of ZnO nanorods strongly affect their electrical properties. We demonstrate that the electronic transport in the nanorods grown on focused ion beam-modified substrates is less sensitive to adsorption/desorption processes, which is related to their uniform nucleation and higher crystalline quality

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials Science in Semiconductor Processing

  • ISSN

    1369-8001

  • e-ISSN

  • Volume of the periodical

    107

  • Issue of the periodical within the volume

    1 March

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    104808

  • UT code for WoS article

    000505017100013

  • EID of the result in the Scopus database

    2-s2.0-85074342993