Nanoscale surface dynamics of RF-magnetron sputtered CrCoCuFeNi high entropy alloy thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F22%3A00563270" target="_blank" >RIV/68081723:_____/22:00563270 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26220/22:PU145900
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S2352492822013642?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S2352492822013642?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.mtcomm.2022.104523" target="_blank" >10.1016/j.mtcomm.2022.104523</a>
Alternative languages
Result language
angličtina
Original language name
Nanoscale surface dynamics of RF-magnetron sputtered CrCoCuFeNi high entropy alloy thin films
Original language description
High entropy alloy (HEA) thin films of CrCoCuFeNi are grown on stainless steel substrate using radiofrequency (RF) magnetron sputtering method at different sputtering times (30, 60 and 90 min), substrate temperatures (room temperature, 100 and 200 deg. Celsius) and RF powers (100, 150 and 200 W). The nanoscale morphology and topography of the thin films are obtained using an atomic force microscopy (AFM) method. The average surface roughness, interface width, fractal and multifractal characteristics of the films are presented. It is shown that the average surface roughness and interface width decrease with the time of deposition while considering the combination of the other factors. The autocorrelation and height-height correlation functions reveal that these surfaces are self-affine and exhibit fractal characteristics. The increase in sputtering power, with different combinations of time and temperature, is related to large fractal dimension and small lacunarity coefficient. The increase in substrate temperature (for different combinations with time and RF power) is shown to enhance the spatial roughness of the HEA thin films. A multifractal analysis undertaken using generalized fractal dimension, mass exponent against moment order and multifractal spectrum reveal that all the films have a multifractal character, and the films deposited at high temperatures and powers exhibit the strongest multifractal behaviour.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20506 - Coating and films
Result continuities
Project
<a href="/en/project/LM2018110" target="_blank" >LM2018110: CzechNanoLab research infrastructure</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials Today Communications
ISSN
2352-4928
e-ISSN
2352-4928
Volume of the periodical
33
Issue of the periodical within the volume
DEC
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
9
Pages from-to
104523
UT code for WoS article
000867516000005
EID of the result in the Scopus database
2-s2.0-85138478357