Performance of detector elements for electron microscopes.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F00%3A12000008" target="_blank" >RIV/68081731:_____/00:12000008 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Performance of detector elements for electron microscopes.

Original language description

Signal processing in scanning and transmission electron microscopes is analysed in this paper. Distinguished are criteria of principal and commercial significance, and problematic parameters of different systems are highlighted. The most important properties of scintillation detection systems and imaging screens are discussed more in detail. For the scintillation detector, the analysis of conversion of the signal to photons, their transport from emission centres to PMT photocathode, and their conversionto photoelectrons is carried out. For the imaging screen, the attention is focused on the spectral matching and spatial resolution.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F98%2F0796" target="_blank" >GA102/98/0796: Imaging single crystal screens for transmission electron microscopy</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Jemná mechanika a optika

ISSN

0447-6441

e-ISSN

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Volume of the periodical

45

Issue of the periodical within the volume

10

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

3

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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