X-ray dark-field refraction-contrast imaging of micro-objects.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F02%3A12020128" target="_blank" >RIV/68081731:_____/02:12020128 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
X-ray dark-field refraction-contrast imaging of micro-objects.
Original language description
An X-ray multilayer mirror, consisting of two periodical reflecting structures separed by a quarter-wave spacer, can be designed to have a very sharp and deep resonant absorption at a definite angle of incidence. Such a mirror may be used as an angular dispersive element for refractive X-ray radiography. In this method, referred to as dark-field refraction-contrast imaging, the image contrast is obtained not due to variation of absorption but due to variation of the refractive index of the object's inner structure. Signal-to-noise ratio in the image can be significantly enhanced, and the dynamical range of the detector can be reduced due to suppression of the shot noise produced by the direct beam. Theoretical basis for this method is developed, providing definite rules for designing of the mirror with resonant absorption, and explaining the limitations on the required detector spatial resolution.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JI - Composite materials
OECD FORD branch
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Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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