Usage of Segmental Ionization Detector in Environmental Conditions.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030028" target="_blank" >RIV/68081731:_____/03:12030028 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Usage of Segmental Ionization Detector in Environmental Conditions.

Original language description

Environmental scanning electron microscope operates with the gaseous environment in the specimen chamber. This environment causes specific conditions for the detection of signal electrons. Classical Everhart-Thornley detector cannot be exploited for thedetection of secondary electrons because of the impossibility to use high enough electric field in a gaseous environment to add sufficient energy to secondary electrons for efficient scintillation. Ionization detector is therefore used for the detectionof signal electrons in environmental SEM most frequently. At this detector a plate electrode with positive potential is positioned above the specimen, which lays on a grounded specimen holder. At operation signal electrons from the specimen are accelerated in electrical field to the positive electrode and are amplified in the process of impact ionisation in a gaseous environment. The positive electrode of the ionisation detects products of ionisation collisions caused by secondary, backs

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F01%2F1271" target="_blank" >GA102/01/1271: Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

9

Issue of the periodical within the volume

Sup. 3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

142-143

UT code for WoS article

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EID of the result in the Scopus database

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