The use of an optically trapped microprobe for scanning details of surface.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030098" target="_blank" >RIV/68081731:_____/03:12030098 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
The use of an optically trapped microprobe for scanning details of surface.
Original language description
We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.
Czech name
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Czech description
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Project
<a href="/en/project/GA101%2F00%2F0974" target="_blank" >GA101/00/0974: Local probe microscopy with an optically trapped probe</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259).
ISBN
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ISSN
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e-ISSN
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Number of pages
4
Pages from-to
166-169
Publisher name
SPIE-The International Society for Optical Engineering
Place of publication
Washington
Event location
Krzyzowa [PL]
Event date
Sep 9, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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