Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F09%3A00335296" target="_blank" >RIV/68081731:_____/09:00335296 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy
Original language description
For examination of thin films by transmitted electrons (TE) the Transmission Electron Microscope is used at primary beam energies in hundreds of keV. The Scanning Electron Microscopes (SEM) utilize reflected electrons in order to image surfaces but recently the TE mode has been introduced into SEM at much lower electron energies.
Czech name
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Czech description
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Project
<a href="/en/project/IAA100650902" target="_blank" >IAA100650902: Scanning transmission electron microscopy with very slow electrons</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS?09)
ISBN
978-80-254-4535-8
ISSN
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e-ISSN
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Number of pages
1
Pages from-to
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Publisher name
ISI AS CR
Place of publication
Brno
Event location
Brno
Event date
Aug 10, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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