Newly Designed Ionisation Secondary Electron Detector with Electrostatic Separators for VP-ESEM

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00353039" target="_blank" >RIV/68081731:_____/10:00353039 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Newly Designed Ionisation Secondary Electron Detector with Electrostatic Separators for VP-ESEM
Original language description
The basic philosophy of our improved ionization SE detector with electrostatic separators (ISEDS), is to optimize the physical principles of the detection in VPSEM or ESEM in order to achieve a higher purity of the secondary electron (SE) signal with a minimum of backscattered electrons (BSEs) and primary electrons (PEs) contribution and enable detection of this signal depending on energy, eventually on spatial distribution of signal electrons emitted from a sample.
Czech name
—
Czech description
—

Project
<a href="/en/project/GAP102%2F10%2F1410" target="_blank" >GAP102/10/1410: The study of the influence of magnetic and electric fields for amplification of secondary electron signals detected by a novel detector in VP-SEM.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th IFSM International Microscopy Congress
ISBN
978-85-63273-06-2
ISSN
—
e-ISSN
—
Number of pages
2
Pages from-to
—
Publisher name
Sociedade Brasileira de Microscopia e Microanilise
Place of publication
Rio de Janeiro
Event location
Rio de Janeiro
Event date
Sep 19, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—

Similar results(10)