SLEEM and its Applications in Material Research
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00379915" target="_blank" >RIV/68081731:_____/12:00379915 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
SLEEM and its Applications in Material Research
Original language description
Scanning Low Energy Electron Microscopy (SLEEM) presents a new approach to material research which has several potential advantages over the traditional Scanning Electron Microscopy (SEM) used in research institutes and laboratories across the world.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22
ISBN
978-1-74052-245-8
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
"409: 1"-"2"
Publisher name
EECW Pty Ltd
Place of publication
Wembley
Event location
Perth
Event date
Feb 5, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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