Characterization of the local crystallinity via reflectance of very slow electrons

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00384097" target="_blank" >RIV/68081731:_____/12:00384097 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.4729879" target="_blank" >http://dx.doi.org/10.1063/1.4729879</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.4729879" target="_blank" >10.1063/1.4729879</a>

Result language
angličtina
Original language name
Characterization of the local crystallinity via reflectance of very slow electrons
Original language description
The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e. g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.
Czech name
—
Czech description
—

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)