Very low energy electron microscopy of graphene flakes

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F13%3A00395127" target="_blank" >RIV/68081731:_____/13:00395127 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1111/jmi.12049" target="_blank" >http://dx.doi.org/10.1111/jmi.12049</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1111/jmi.12049" target="_blank" >10.1111/jmi.12049</a>

Result language

angličtina

Original language name

Very low energy electron microscopy of graphene flakes

Original language description

Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Microscopy

ISSN

0022-2720

e-ISSN

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Volume of the periodical

251

Issue of the periodical within the volume

2

Country of publishing house

GB - UNITED KINGDOM

Number of pages

5

Pages from-to

123-127

UT code for WoS article

000321618700003

EID of the result in the Scopus database

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