Scanning Electron Microscopy With Slow Electrons

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F13%3A00398028" target="_blank" >RIV/68081731:_____/13:00398028 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Scanning Electron Microscopy With Slow Electrons

Original language description

Scanning low energy electron microscopy (SLEEM) with a catode lens provides improved image resolution at low energies, an enhanced signal of secondary electrons, a completely collected signal of backscattered electron (BSE) including very low energy electrons that are traditionally abandoned, and plenty of contrast mechnism not available with fast incident electrons.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

19

Issue of the periodical within the volume

S2

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

372-373

UT code for WoS article

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EID of the result in the Scopus database

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