Graphene examined with very slow electrons

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450825" target="_blank" >RIV/68081731:_____/15:00450825 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Graphene examined with very slow electrons
Original language description
Electron microscopy of materials composed of light elements suffers from low image contrast, particularly in the transmission microscopy of biomedical specimens. Post-fixation or staining with heavy metal salts that highlight certain structural details is a partially successful aid in routine microscopy. In order to examine mutually overlapped flakes of two-dimensional crystals such as graphene we need to obtain a contrast contribution from a single layer of carbon atoms. This task requires increasing the scattering rate of incident electrons by means of a drastic lowering of their energy to hundreds of eV or less. The cathode lens principle implemented in the SEM, and recently in the STEM mode as well, makes it possible to use an arbitrarily low energy in both reflection and transmission modes. Contrasts between sites differing in thickness by a single graphene layer are demonstrated at 220 eV. The high lateral resolution of ultra-low-energy STEM with a cathode lens enabled us to meas
Czech name
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Czech description
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Project
<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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