Effect of Native Oxide on Reflectivity of Slow and Super Slow Electrons from Mild Steel Surface
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00536023" target="_blank" >RIV/68081731:_____/20:00536023 - isvavai.cz</a>
Result on the web
<a href="https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/effect-of-native-oxide-on-reflectivity-of-slow-and-super-slow-electrons-from-mild-steel-surface/A38DD155B92DD04E066D1DB4E6CE86FC" target="_blank" >https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/effect-of-native-oxide-on-reflectivity-of-slow-and-super-slow-electrons-from-mild-steel-surface/A38DD155B92DD04E066D1DB4E6CE86FC</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927620016669" target="_blank" >10.1017/S1431927620016669</a>
Alternative languages
Result language
angličtina
Original language name
Effect of Native Oxide on Reflectivity of Slow and Super Slow Electrons from Mild Steel Surface
Original language description
Modern commercial scanning electron microscopes (SEMs) are equipped with a cathode lens mode, which enables us to use extremely low landing energies of the primary electrons. There are many benefits of the low energy electron microscopy and this technique has been recognized as an important tool for the characterization of advanced steels. At lower energies, the contrast in SEM micrographs is more and more influenced by the surface and its state. In this study, we investigated the effect of a native oxide layer on the contrast in SEM images of a mild steel surface obtained at energies from 5 keV up to units of eV shows a series of the SEM micrographs of mild steel collected by anin-house designed ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). The micrographs of the same area of view were obtained with various landing energies of the primary beam.
Czech name
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Czech description
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Classification
Type
J<sub>ost</sub> - Miscellaneous article in a specialist periodical
CEP classification
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OECD FORD branch
20501 - Materials engineering
Result continuities
Project
<a href="/en/project/TN01000008" target="_blank" >TN01000008: Center of electron and photonic optics</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
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Volume of the periodical
26
Issue of the periodical within the volume
S2
Country of publishing house
US - UNITED STATES
Number of pages
3
Pages from-to
1012-1014
UT code for WoS article
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EID of the result in the Scopus database
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