All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Electron reflectivity from clean and oxidized steel surface

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F22%3A00565515" target="_blank" >RIV/68081731:_____/22:00565515 - isvavai.cz</a>

  • Result on the web

    <a href="https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.7079" target="_blank" >https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.7079</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/sia.7079" target="_blank" >10.1002/sia.7079</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Electron reflectivity from clean and oxidized steel surface

  • Original language description

    This paper aims to elucidate the effect of an air-formed native oxide covering mild steel surface on the contrast in the scanning electron microscopy (SEM) images obtained with the landing energy from 5 keV down to 0 eV. Part of the mild steel surface was in-situ cleaned by Ar+ ion sputtering process in order to remove native oxide from the surface. It enabled us to observe the oxide-free and the naturally oxidized area on the mild steel surface simultaneously in the SEM micrographs. Presence of the native oxide starts to play a role in the SEM images acquired at landing energy below roughly 3 keV. Contrast between differently oriented grains situated inside the area covered by the native oxide starts to be negligible with landing energy decreasing below 3 keV, up to some ultra-low values where the contrast increases again. Total reflectivity contrast between the clean and the oxidized area increases exponentially with landing energy decreasing below 3 keV. The reflectivity-versus-energy curves of the cleaned and the naturally oxidized mild steel surface are markedly different. The reflectivity of the electrons is correlated with the density of states (DOS), as is demonstrated at very low landing energies. Sensitivity of the very low-energy electrons to the electronic structure was verified by comparison of the experimental data with the simulations of reflectivities, band structure, and DOS. The theoretical predictions are based on the density-functional theory calculations and they have been performed in energy range corresponding to specular reflectivities of the Fe-BCC (001) orientation. We have also observed that close to the mirror condition, that is, near-zero landing energies, the primary electrons become sensitive to the surface potential differences caused by the work function differences of clean and native oxide-covered steel surfaces.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

    <a href="/en/project/TN01000008" target="_blank" >TN01000008: Center of electron and photonic optics</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Surface and Interface Analysis

  • ISSN

    0142-2421

  • e-ISSN

    1096-9918

  • Volume of the periodical

    54

  • Issue of the periodical within the volume

    6

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    10

  • Pages from-to

    667-676

  • UT code for WoS article

    000760336000001

  • EID of the result in the Scopus database

    2-s2.0-85125073168