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Optimal X-ray detection for thin samples in low-energy STEM

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00460207" target="_blank" >RIV/68081731:_____/16:00460207 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.trends.isibrno.cz/" target="_blank" >http://www.trends.isibrno.cz/</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optimal X-ray detection for thin samples in low-energy STEM

  • Original language description

    In many applications it is desirable to perform energy-dispersive X-ray spectroscopy (EDS) on very thin samples at low primary beam energies in a STEM. Thin samples, or lamellae, with the thickness of about 10 nm, are mostly prepared in focused ion beam instruments (FIBs), and they are used to evaluate experiments in the development of thin films and coatings, in the semiconductor industry, and in other applications. EDS then provides a map of different chemical elements or compounds in the sample, obtained by scanning the electron beam in a raster. Often the qualitative composition is known as a limited set of materials and only their distribution on the sample is to be determined. For large batches of samples fast measurements are desired to maximize utilization of expensive equipment. In this study we found a method to minimize the time needed to reliably acquire an elemental map by determining the optimal detector placement and the minimal necessary primary electron dose per pixel.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

  • ISBN

    978-80-87441-17-6

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    44-45

  • Publisher name

    Institute of Scientific Instruments CAS

  • Place of publication

    Brno

  • Event location

    Skalský dvůr

  • Event date

    May 29, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000391254000020