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Local Electron Microanalysis in Microprobe and Electron Microscopes

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F11%3A00192257" target="_blank" >RIV/68407700:21220/11:00192257 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21220/11:00192341

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Local Electron Microanalysis in Microprobe and Electron Microscopes

  • Original language description

    Electron microanalysis uses an electron beam to excite characteristic X-rays and to determine from their intensity the elemental composition of a material. As an analytical technique, it can be incorporated into an electron microscope to utilize the generation of X-ray photons for observing thin samples and bulk samples in various types of electron microscopes. A quantitative method for bulk samples was first used by R. Castaing in France, and the method was improved by K.F.J. Heinrich and co-workers inUSA. The special devices used for applying this method are usually called ?microprobes?. The method is often called ?electron probe microanalysis?, though a microprobe is the name for a very thin electron beam used for local microanalysis.

  • Czech name

  • Czech description

Classification

  • Type

    O - Miscellaneous

  • CEP classification

    JJ - Other materials

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů