Local Electron Microanalysis in Microprobe and Electron Microscopes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F11%3A00192257" target="_blank" >RIV/68407700:21220/11:00192257 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21220/11:00192341
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Local Electron Microanalysis in Microprobe and Electron Microscopes
Original language description
Electron microanalysis uses an electron beam to excite characteristic X-rays and to determine from their intensity the elemental composition of a material. As an analytical technique, it can be incorporated into an electron microscope to utilize the generation of X-ray photons for observing thin samples and bulk samples in various types of electron microscopes. A quantitative method for bulk samples was first used by R. Castaing in France, and the method was improved by K.F.J. Heinrich and co-workers inUSA. The special devices used for applying this method are usually called ?microprobes?. The method is often called ?electron probe microanalysis?, though a microprobe is the name for a very thin electron beam used for local microanalysis.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
JJ - Other materials
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů