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The information depth of backscattered electron imaging

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00460208" target="_blank" >RIV/68081731:_____/16:00460208 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.trends.isibrno.cz/" target="_blank" >http://www.trends.isibrno.cz/</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    The information depth of backscattered electron imaging

  • Original language description

    Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electrons generally reflect surface properties of the sample, while the backscattered electrons (BSE) are capable of providing information about complex properties of the target down to a certain subsurface depth. Contrast mechanisms are combined according to the energy of incident electrons and energy and angular acceptance of BSE detection. In all cases, a question arises concerning the information depth of this mode. No applicable answer provides a definition declaring this depth as that from which we still obtain useful information about the object. We can employ software simulating the electron scattering in solids,nwhile experimental approaches are also possible. Moreover, two analytic formulas can be found in the literature.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

  • ISBN

    978-80-87441-17-6

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    46-47

  • Publisher name

    Institute of Scientific Instruments CAS

  • Place of publication

    Brno

  • Event location

    Skalský dvůr

  • Event date

    May 29, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000391254000021