Unconventional Imaging with Backscattered Electrons
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F11%3A00367773" target="_blank" >RIV/68081731:_____/11:00367773 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1017/S143192761100537X" target="_blank" >http://dx.doi.org/10.1017/S143192761100537X</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S143192761100537X" target="_blank" >10.1017/S143192761100537X</a>
Alternative languages
Result language
angličtina
Original language name
Unconventional Imaging with Backscattered Electrons
Original language description
Immesrsion of the sample in a scanning electron microscope to strong electric field enables one to acquire the backscattered electrons (BSE) throughout full energy and angle range of emission. BSE emitted at high angles off the surface normal provide extended crystallographic information with high grain contrast sensitive to details including visualization of the internal stress. At very low energies the BSE yield may serve as fingerprinting the grain orientation. The dopant contrast can be obtained viainjection of very slow electrons.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
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Volume of the periodical
17
Issue of the periodical within the volume
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Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
900-901
UT code for WoS article
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EID of the result in the Scopus database
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