Low Energy Reflection and High Angle Reflection of Electrons in the SEM

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00352416" target="_blank" >RIV/68081731:_____/10:00352416 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Low Energy Reflection and High Angle Reflection of Electrons in the SEM
Original language description
An important role of the scanning electron microscopy (SEM) is to image and examine the local crystallinic structure of materials. As an alternative to the traditional EBSD method, suffering from slow data collection and limited lateral resolution, employment of very slow backscattered electrons (BSE) and of BSE leaving the sample at high angles with respect to the surface normal appears very promising. Neither of these signals is available in conventional SEM devices as the former species have insufficient energy to be detected while the later usually miss the detector.
Czech name
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Czech description
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Project
<a href="/en/project/OE08012" target="_blank" >OE08012: Contrast and detection in scanning electron microscopy</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th IFSM International Microscopy Congress
ISBN
978-85-63273-06-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Sociedade Brasileira de Microscopia e Microanilise
Place of publication
Rio de Janeiro
Event location
Rio de Janeiro
Event date
Sep 19, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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