GAGG:ce single crystalline films: New perspective scintillators for electron detection in SEM

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465030" target="_blank" >RIV/68081731:_____/16:00465030 - isvavai.cz</a>

Alternative codes found

RIV/00216208:11320/16:10329980 RIV/00216224:14310/16:00094199

Result on the web

<a href="http://dx.doi.org/10.1016/j.ultramic.2016.01.003" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2016.01.003</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ultramic.2016.01.003" target="_blank" >10.1016/j.ultramic.2016.01.003</a>

Result language

angličtina

Original language name

GAGG:ce single crystalline films: New perspective scintillators for electron detection in SEM

Original language description

Single crystal scintillators are frequently used for electron detection in scanning electron microscopy (SEM). We report gadolinium aluminum gallium garnet (GAGG:Ce) single crystalline films as a new perspective scintillators for the SEM. For the first time, the epitaxial garnet films were used in a practical application: the GAGG:Ce scintillator was incorporated into a SEM scintillation electron detector and it showed improved image quality. In order to prove the GAGG:Ce quality accurately, the scintillation properties were examined using electron beam excitation and compared with frequently used scintillators in the SEM. The results demonstrate excellent emission efficiency of the GAGG:Ce single crystalline films together with their very fast scintillation decay useful for demanding SEM applications.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Ultramicroscopy

ISSN

0304-3991

e-ISSN

—

Volume of the periodical

163

Issue of the periodical within the volume

APR

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

5

Pages from-to

1-5

UT code for WoS article

000373526100001

EID of the result in the Scopus database

2-s2.0-84956991203