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Multicomponent garnet film scintillators for SEM electron detectors

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465105" target="_blank" >RIV/68081731:_____/16:00465105 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.5236" target="_blank" >http://dx.doi.org/10.1002/9783527808465.EMC2016.5236</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.5236" target="_blank" >10.1002/9783527808465.EMC2016.5236</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Multicomponent garnet film scintillators for SEM electron detectors

  • Original language description

    With an Everhart-Thornley (ET) scintillation detector in SEM, an image is formed by signal electrons emerged after an interaction of focused scanning electron beam with the specimen surface. In such a case a scintillator plays an important role as a fast electron-photon signal conversion element. A selection of fast scintillation materials is very limited, because the only mechanism for scintillators applicable in SEM ET detectors consists in allowed 5d-4f transitions in lanthanide ions. Unfortunately, the widely used Czochralski grown single crystal YAG:Ce scintillators suffer from an afterglow, which deteriorate the ability to transfer high image contrast. The mentioned afterglow in the bulk single crystal is caused by inevitable structural defects, such as antisite defects. These trap states are responsible not only for delayed radiative recombination causing the afterglow, but also for a degradation of the light yield. The aim of this study is to introduce new multicomponent garnet film scintillators for SEM electron detectors that due to the substitution of Al by Ga in the Gd3Al5O12:Ce garnet extensively supress the shallow traps resulting in a significant increase of the cathodoluminescence (CL) efficiency and in improvement of the afterglow characteristics.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    EMC2016. The 16th European Microscopy Congress. Proceedings

  • ISBN

    9783527808465

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    374-375

  • Publisher name

    Wiley

  • Place of publication

    Oxford

  • Event location

    Lyon

  • Event date

    Aug 28, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article