Multicomponent garnet film scintillators for SEM electron detectors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465105" target="_blank" >RIV/68081731:_____/16:00465105 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.5236" target="_blank" >http://dx.doi.org/10.1002/9783527808465.EMC2016.5236</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.5236" target="_blank" >10.1002/9783527808465.EMC2016.5236</a>
Alternative languages
Result language
angličtina
Original language name
Multicomponent garnet film scintillators for SEM electron detectors
Original language description
With an Everhart-Thornley (ET) scintillation detector in SEM, an image is formed by signal electrons emerged after an interaction of focused scanning electron beam with the specimen surface. In such a case a scintillator plays an important role as a fast electron-photon signal conversion element. A selection of fast scintillation materials is very limited, because the only mechanism for scintillators applicable in SEM ET detectors consists in allowed 5d-4f transitions in lanthanide ions. Unfortunately, the widely used Czochralski grown single crystal YAG:Ce scintillators suffer from an afterglow, which deteriorate the ability to transfer high image contrast. The mentioned afterglow in the bulk single crystal is caused by inevitable structural defects, such as antisite defects. These trap states are responsible not only for delayed radiative recombination causing the afterglow, but also for a degradation of the light yield. The aim of this study is to introduce new multicomponent garnet film scintillators for SEM electron detectors that due to the substitution of Al by Ga in the Gd3Al5O12:Ce garnet extensively supress the shallow traps resulting in a significant increase of the cathodoluminescence (CL) efficiency and in improvement of the afterglow characteristics.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EMC2016. The 16th European Microscopy Congress. Proceedings
ISBN
9783527808465
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
374-375
Publisher name
Wiley
Place of publication
Oxford
Event location
Lyon
Event date
Aug 28, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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