Superfast scintillators for SEM electron detectors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00481584" target="_blank" >RIV/68081731:_____/17:00481584 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Superfast scintillators for SEM electron detectors
Original language description
Scanning electron microscopes (SEM) require a high-quality electron detector. Such an electron detector must primarily be very fast to process a large number of imaging data in real time. For example, for the acquisition of a high-quality image in a scanning electron microscope (SEM) in real time, it is usually required to process each pixel in less than 100 ns without a loss of contrast. If the mentioned electron detectors are to be formed by scintillation detection systems, they must be equipped with very fast scintillators having a short decay time (decay to 1/e value, where e is the base of natural logarithms) and low afterglow even at a microsecond time range after an excitation cut-off. The scintillator with the long decay time causes an image blur and the scintillator with the high afterglow reduces image contrast in the SEM. In the scintillation electron detectors, Czochralski grown single-crystal scintillators such as YAG:Ce and YAP:Ce, whose cathodoluminescence (CL) properties have been thoroughly studied, are commonly used.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
13th Multinational Congress on Microscopy: Book of Abstracts
ISBN
978-953-7941-19-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
132-133
Publisher name
Ruder Bošković Institute, Croatian Microscopy Society
Place of publication
Zagreb
Event location
Rovinj
Event date
Sep 24, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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