Backscattered electron imaging using the improved YAG scintillation detector.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030030" target="_blank" >RIV/68081731:_____/03:12030030 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Backscattered electron imaging using the improved YAG scintillation detector.
Original language description
It is known that the E-T scintillation PMT system [1] represents the most efficient detector of signal electrons in the SEM. Today, practically all types of SEMs are standardly equipped with this detector for the detection of secondary electrons (SEs). For backscattered electrons (BSEs) not only scintillation detector but also semiconductor and channel plate detectors are used. The highest detection quantum efficiency (DQE) is achieved with the scintillation detector on the basis of the yttrium aluminium garnet single crystal scintillator (YAG)[2].
Czech name
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Czech description
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Project
<a href="/en/project/IBS2065107" target="_blank" >IBS2065107: Scanning electron microscopy for research of structure of wet materials</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 6th Multinational Congress on Microscopy - European Extension.
ISBN
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ISSN
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e-ISSN
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Number of pages
2
Pages from-to
450-451
Publisher name
Croatian Society for Electron Microscopy
Place of publication
Zagreb
Event location
Pula [HR]
Event date
Jun 1, 2003
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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