Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465206" target="_blank" >RIV/68081731:_____/16:00465206 - isvavai.cz</a>

Alternative codes found

RIV/60077344:_____/16:00465206

Result on the web

<a href="http://dx.doi.org/10.1017/S143192761600547X" target="_blank" >http://dx.doi.org/10.1017/S143192761600547X</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S143192761600547X" target="_blank" >10.1017/S143192761600547X</a>

Result language

angličtina

Original language name

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Original language description

Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc.. Usually, in a conventional TEM (typical acceleration voltage 60 – 300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). Low voltage STEM allows to image unstained samples that usually show sufficient contrast, but in some cases the staining can be useful. An important parameter for imaging is a sensitivity of the sample to degradation by electron beam. There have been not many studies describing quantitatively the mass loss of the resin sections; the most comprehensive work was performed on the dedicated STEM for molecular mass measurements done at 80 keV, or even at higher electron energies done by EFTEM. The author in [6] describes that polymers stained with a heavy metal should therefore damage more rapidly through the secondary electron mechanism and higher cross sections for scattering.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

22

Issue of the periodical within the volume

S3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

926-927

UT code for WoS article

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EID of the result in the Scopus database

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