Electron beam induced mass loss dependence on aging of Epon resin sections

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60077344%3A_____%2F15%3A00452276" target="_blank" >RIV/60077344:_____/15:00452276 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/15:00452276
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Electron beam induced mass loss dependence on aging of Epon resin sections
Original language description
It has been recently shown that low voltage STEM (Scanning Transmission Electron Microscope) can be regarded as the method of choice for many studies of biological samples. Main advantage of this technique is that it allows one to image samples with lowcontrast. Usually, in a standard STEM (typical acceleration voltage 60?300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). This is not necessarily in low voltage STEM. Consequently, investigated structures are closer to native state of investigated samples. During sample preparation biological material is embedded in a resin which is observed in microscope in a form of ultrathin sections. There is commercially available wide spectrum of resins with different properties for embedding samples in a range from soft tissues to bones. They have various parameters such as hardness, mechanical stability, penetrability. For imaging an important parameter is a sensitivity to degrada
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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