Examination of 2D crystals in a low voltage SEM/STEM

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00481591" target="_blank" >RIV/68081731:_____/17:00481591 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Examination of 2D crystals in a low voltage SEM/STEM

Original language description

Development of new types of materials such as 2D crystals (graphene, MoS2, WS2, h-BN, etc.) requires emergence of new surface-sensitive techniques for their characterization. As regards the “surface” sensitivity, the (ultra) low energy electron microscopy can become a very powerful tool for true examination of these atom-thick materials, capable of confirming physical phenomena predicted to occur on their surfaces. Modern commercial scanning electron microscopes enable imaging and analyses by low energy electrons even at very high magnification. In the case of the SEM, resolution even below 1 nm can be achieved at low landing energy of electrons. Since specimen contamination increases with increasing electron dose and decreasing landing energy, specimen cleanness is a critical factor in obtaining meaningful data. A range of various specimen cleaning methods can be applied to selected samples. Typical cleaning methods, such as solvent rinsing, heating, bombarding with ions and plasma etching have their limitations. Electron-induced in situ cleaning procedure can be gentle, experimentally convenient and very effective for wide range of specimens. Even a small amount of hydrocarbon contamination can severely impact on the results obtained with low energy electrons, as illustrated in Figure 1A. During the scanning of surfaces by electrons, the image usually darkens because of a carbonaceous layer gradually deposited on the top from adsorbed hydrocarbon precursors.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

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OECD FORD branch

20506 - Coating and films

Project

<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

13th Multinational Congress on Microscopy: Book of Abstracts

ISBN

978-953-7941-19-2

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

618-619

Publisher name

Ruder Bošković Institute, Croatian Microscopy Society

Place of publication

Zagreb

Event location

Rovinj

Event date

Sep 24, 2017

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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