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Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1 eV landing energy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F19%3A00508160" target="_blank" >RIV/68081731:_____/19:00508160 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S0304399118303450?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0304399118303450?via%3Dihub</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.ultramic.2019.04.014" target="_blank" >10.1016/j.ultramic.2019.04.014</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1 eV landing energy

  • Original language description

    In this study, we investigated an observation technique by super low energy scanning electron microscopy (SLESEM) at below 5 eV and its contrast mechanism for analyzing complex microstructures of a multiphase steel consisting of ferrite, martensite and austenite. With SLESEM at 1 eV, the three phases were observed as different brightness levels, ferrite as the darkest contrast, martensite as the second brightest and austenite as the brightest. These contrasts disappeared at 2 eV or higher. Similar contrasts and phenomena were also observed in the results of low energy electron microscopy (LEEM). According to the energy dependences of the LEEM intensities of the three phases, the threshold energies of the transition from electron reflection to surface impact were determined to be 0.00 eV, 0.15 eV and 0.39 eV for ferrite, martensite and austenite, respectively. These differences in thresholds indicate that the potentials on the surfaces of each phase are different, which is considered to result in the different brightness of each phase. This potential differences are probably due to the contact potentials generated when phases with different work functions contact each other. Although the sample is covered by a thin native oxide film (several nm thickness), the potentials can affect the incident electrons through the oxide film.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Ultramicroscopy

  • ISSN

    0304-3991

  • e-ISSN

  • Volume of the periodical

    204

  • Issue of the periodical within the volume

    SEP

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    5

  • Pages from-to

    1-5

  • UT code for WoS article

    000472485000001

  • EID of the result in the Scopus database

    2-s2.0-85065192466