Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1 eV landing energy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F19%3A00508160" target="_blank" >RIV/68081731:_____/19:00508160 - isvavai.cz</a>
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0304399118303450?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0304399118303450?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2019.04.014" target="_blank" >10.1016/j.ultramic.2019.04.014</a>
Alternative languages
Result language
angličtina
Original language name
Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1 eV landing energy
Original language description
In this study, we investigated an observation technique by super low energy scanning electron microscopy (SLESEM) at below 5 eV and its contrast mechanism for analyzing complex microstructures of a multiphase steel consisting of ferrite, martensite and austenite. With SLESEM at 1 eV, the three phases were observed as different brightness levels, ferrite as the darkest contrast, martensite as the second brightest and austenite as the brightest. These contrasts disappeared at 2 eV or higher. Similar contrasts and phenomena were also observed in the results of low energy electron microscopy (LEEM). According to the energy dependences of the LEEM intensities of the three phases, the threshold energies of the transition from electron reflection to surface impact were determined to be 0.00 eV, 0.15 eV and 0.39 eV for ferrite, martensite and austenite, respectively. These differences in thresholds indicate that the potentials on the surfaces of each phase are different, which is considered to result in the different brightness of each phase. This potential differences are probably due to the contact potentials generated when phases with different work functions contact each other. Although the sample is covered by a thin native oxide film (several nm thickness), the potentials can affect the incident electrons through the oxide film.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20501 - Materials engineering
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Ultramicroscopy
ISSN
0304-3991
e-ISSN
—
Volume of the periodical
204
Issue of the periodical within the volume
SEP
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
1-5
UT code for WoS article
000472485000001
EID of the result in the Scopus database
2-s2.0-85065192466