All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F19%3A00522074" target="_blank" >RIV/68081731:_____/19:00522074 - isvavai.cz</a>

  • Result on the web

    <a href="https://aip.scitation.org/doi/10.1063/1.5128300" target="_blank" >https://aip.scitation.org/doi/10.1063/1.5128300</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.5128300" target="_blank" >10.1063/1.5128300</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade

  • Original language description

    The signal generation mechanism of the scanning field-emission microscope has been investigated via model calculations combining deterministic trajectory calculations in the field surrounding the field-emission tip in vacuum, with Monte Carlo simulations of the electron transport inside the solid. This model gives rise to a two-dimensional electron cascade. Individual trajectories of detected backscattered electrons consist of repeated segments of travel in vacuum followed by a re-entry into the solid and re-emission into vacuum after being elastically or inelastically scattered. These so-called electron bouncing events also create secondary electrons at macroscopic distances away from the primary impact position. The signal reaching the detector is made up of elastically and inelastically backscattered primary electrons created near the impact position under the tip and those secondary electrons created far away from it.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Physics Letters

  • ISSN

    0003-6951

  • e-ISSN

  • Volume of the periodical

    115

  • Issue of the periodical within the volume

    25

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    5

  • Pages from-to

    251604

  • UT code for WoS article

    000505535900034

  • EID of the result in the Scopus database

    2-s2.0-85076813179