Detection of backscattered electrons in environmental scanning electron microscope.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030032" target="_blank" >RIV/68081731:_____/03:12030032 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Detection of backscattered electrons in environmental scanning electron microscope.
Original language description
Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and backscattered electrons are very often used to obtain information about the specimen. In ESEM secondary electrons are mostly detected by a ionisation detector, while backscattered electrons are detected by a scintillation detector.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F1271" target="_blank" >GA102/01/1271: Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 6th Multinational Congress on Microscopy - European Extension.
ISBN
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ISSN
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e-ISSN
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Number of pages
2
Pages from-to
489-490
Publisher name
Croatian Society for Electron Microscopy
Place of publication
Zagreb
Event location
Pula [HR]
Event date
Jun 1, 2003
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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