Analysis of the Various Effects of Coating W Tips with Dielectric Epoxylite 478 Resin or UPR-4 Resin Coatings under Similar Operational Conditions

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00533859" target="_blank" >RIV/68081731:_____/20:00533859 - isvavai.cz</a>

Result on the web

<a href="http://journals.yu.edu.jo/jjp/JJPIssues/Vol13No3pdf2020/2.html" target="_blank" >http://journals.yu.edu.jo/jjp/JJPIssues/Vol13No3pdf2020/2.html</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.47011/13.3.2" target="_blank" >10.47011/13.3.2</a>

Result language

angličtina

Original language name

Analysis of the Various Effects of Coating W Tips with Dielectric Epoxylite 478 Resin or UPR-4 Resin Coatings under Similar Operational Conditions

Original language description

The objective of this work is to study the differences that occur in behavior and properties of the emitted electron beam from tungsten (W) tips before and after coating these tips with a thin layer of a good proven dielectric material. Core metallic tips have been prepared from a polycrystalline (99.995% purity) tungsten (W) wire. Analysis has been carried out for clean W emitters before and after coating these tips with two differences types of epoxy resins, namely: (Epoxylite 478 and UPR-4). For critical comparison and analysis, several tungsten tips with various apex- radii (very sharp) have been prepared with the use of electrochemical etching techniques. The tips have been coated by dielectric thin films of various thicknesses. Their characteristics have been recorded before and after the process of coating. These measurements have included the current-voltage (I-V) characteristics, Fowler-Nordheim (F-N) plots, visible light microscope (VLM) image and scanning electron microscope (SEM) micrographs to measure the influence of the Epoxylite resin coating's thickness on the tips after coating. Special distributions have been recorded from the phosphorescent screen of a field electron emission microscope as well. Comparing the two sets of composite systems tested under similar conditions has provided several advantages. Recording highly interesting phenomena has produced a wide opportunity to develop a new type of emitter that includes the most beneficial features of both types.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2020

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Jordan Journal of Physics

ISSN

1994-7607

e-ISSN

—

Volume of the periodical

13

Issue of the periodical within the volume

3

Country of publishing house

JO - JORDAN

Number of pages

9

Pages from-to

191-199

UT code for WoS article

000577571800002

EID of the result in the Scopus database

2-s2.0-85094944890