Influence of Geometrical Arrangements of Si Tip Arrays Fabricated by Laser Micromachining on their Emission Behaviour
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F21%3A00554495" target="_blank" >RIV/68081731:_____/21:00554495 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/9600717" target="_blank" >https://ieeexplore.ieee.org/document/9600717</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IVNC52431.2021.9600717" target="_blank" >10.1109/IVNC52431.2021.9600717</a>
Alternative languages
Result language
angličtina
Original language name
Influence of Geometrical Arrangements of Si Tip Arrays Fabricated by Laser Micromachining on their Emission Behaviour
Original language description
Densely packed emitters on a field emission array lead typically to mutual shielding. Taking biology as a role model for geometric arrangements could be a way to reduce this effect. For comparison, two electron sources, one with a spiral and a second with conventional rectangular (orthogonal) arranged emitters, were fabricated and investigated. Emission currents of 6 μA in the spiral ordered array and 120 μA in the rectangular array were reached with an extraction voltage of 400 V. From a mid-term measurement over 1 h a current stability of ±8.8 % (spiral) respectively ±5.7 % (rectangular) with a mean degradation of3.0 μA/h (spiral) and0.12 μA/h (rectangular) could be observed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2021 34th International Vacuum Nanoelectronics Conference (IVNC)
ISBN
978-1-6654-2589-6
ISSN
2380-6311
e-ISSN
—
Number of pages
2
Pages from-to
(2021)
Publisher name
IEEE
Place of publication
New York
Event location
online
Event date
Jul 5, 2021
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000742045500072