Characterization and Analysis of Field Electron Emission from Copper Tips
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F24%3A00617495" target="_blank" >RIV/68081731:_____/24:00617495 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/10652547" target="_blank" >https://ieeexplore.ieee.org/document/10652547</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IVNC63480.2024.10652547" target="_blank" >10.1109/IVNC63480.2024.10652547</a>
Alternative languages
Result language
angličtina
Original language name
Characterization and Analysis of Field Electron Emission from Copper Tips
Original language description
In the present investigation, field electron emission (FEE) from high-purity copper emitters has been studied under vacuum conditions of approximately 10(-5) mbar. This research aimed to study the emission properties of copper under low-pressure environments, which is essential for applications in fields such as electron microscopy and vacuum electronics. The current-voltage (I-V) characteristics are analyzed utilizing Murphy-Good (MG) method plots in this study. In addition, a Scanning Electron Microscope with Energy-Dispersive X-ray Spectroscopy (SEM-EDS) was used to visualize the surface of the emitters and analyze sample purity. The spatial distribution of electron emission and current stability were obtained as well to analyze electron emission behavior from the surface of the tips. Electron mapping demonstrated a consistent component distribution throughout the copper tips, showing uniformity in their composition. The current-voltage characteristics showed a notable switching phenomenon that is explained by the existence of a thin oxide layer formed on the emitter's surfaces. This thin oxide layer provides additional quantum barrier for the surface.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024
ISBN
979-8-3503-7977-8
ISSN
2164-2370
e-ISSN
—
Number of pages
2
Pages from-to
82-83
Publisher name
IEEE
Place of publication
New York
Event location
Brno
Event date
Jul 15, 2024
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
001310530600076